Bruker Dektak XT Benchtop Stylus Profilometer
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59394869
274985
Tue Aug 20 04:00:00 UTC 2024
Bruker Dektak XT Benchtop Stylus Profilometer Stylus Force: 0.03-15mg, Tip Radius: 12.5 um, Scan Length: 50-55mm, Vertical Range: 1mm, Vertical Resolution: 0.1nm, Date Points per Scan: 120,000 Max, Sample Stage: 100mm Manual X/Y with Manual Leveling, or Motorized 150mm, Sample Thickness: 50mm Max, Sample Dia.: 200mm Max, with 24" x 18" x 3" Granite Plate, Dell OptiPlex 3040 PC with Software, Dell Monitor, & Workstation, , S/N L01V1Y0 [Loc: Component Development Lab]
  • General

Auction Date & Time

Tue, Aug 20, 2024 4:00AM

US/Central

Preview

Monday, August 19th from 9am to 4pm or by appointment
 

Location

Eau Claire

Bruker Dektak XT Benchtop Stylus Profilometer

Bruker Dektak XT Benchtop Stylus Profilometer Stylus Force: 0.03-15mg, Tip Radius: 12.5 um, Scan Length: 50-55mm, Vertical Range: 1mm, Vertical Resolution: 0.1nm, Date Points per Scan: 120,000 Max, Sample Stage: 100mm Manual X/Y with Manual Leveling, or Motorized 150mm, Sample Thickness: 50mm Max, Sample Dia.: 200mm Max, with 24" x 18" x 3" Granite Plate, Dell OptiPlex 3040 PC with Software, Dell Monitor, & Workstation, , S/N L01V1Y0 [Loc: Component Development Lab]